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1、current weather───当前天气；现在天气
2、tidal current───n.潮流
3、current situation───现状，目前形势；现况；时势; 现状
4、current speed───流速；当前速度
5、current───adj.现在的；流通的，通用的；最近的；草写的；n.（水，气，电）流；趋势；涌流；n. (Current)（英）柯伦特（人名）
6、current debt───短期债务
7、rated current───[电]额定电流；规定电流
8、current flowing───电流
9、current topics───当前的主题
1、One approach is to convert the current test-tube setup into a paper-strip one.───一个方法是将当前的试管测试装置转变为条形纸装置。
2、Aiming at the difficult problems that encountered by the Pressure Testing Device inside the gun pressure in the current test.───本文针对膛内压力测试装置在当今测试中遇到的问题。
3、The sub-threshold current test, which is often done at the wafer level, is a measure of how quickly the device will turn on and off.───亚阈区电流测试常常在晶圆片级进行。它是表示器件打开和关闭的快慢程度的参数。
4、If an infection is present, the current test cannot determine whether it was triggered by just one genotype or multiple types of HPV.───如果存在感染，现有检测不能确定是由一种还是多种HPV基因型所触发的。
5、SAP current test automation paradigm and its challenges.───SAP当前的测试自动化范型及其挑战。
6、CURRENT TEST METHODS - involvement with industry groups guarantees materials exceed current electrical and micro contamination standards.───电流测试方法-材料与产业团体参与担保超过目前电器及微污染标准。
7、In this case, the current test case should be aborted immediately.───在这种情况下，应使当前测试立即失败终止。
8、Among the NDT methods used to inspect heat exchangers' flaws and crack, there are PT UT Eddy current test and laparoscope inspection.───其中，非PoHuai检测技术采用PT、UT、涡电流及内视镜等方式，进行设备现况缺陷或裂缝之检查；
9、What is our current test creation velocity and what has it been for the duration of the project?───我们当前的测试的创建速度是多少，以及在项目过程中曾经是多少？
1、Renault's current test driver Heikki Kovalainen is another Finn waiting in the wings.
2、Based on the improved method, we have designed a current lead with varying cross-section for critical current test of HTS YBCO tape with less conductive heat loss.
3、Large-scale impulse current test platform is the key equipment for lightning protection production tests and its quality inspection.
4、The foundation of the management systems of current test storage that can automatically build-up examination papers and meet the need of the users and didactical outlines was established.
5、Dynamic current testing can detect some faults that cannot be detected by voltage based test method and quiescent current test method.
6、The sub-threshold current test, which is often done at the wafer level, is a measure of how quickly the device will turn on and off.
7、Current test methods for accessing Average Seek Times are based on several myths.
8、The vehicle did not have a current test certificate at the time of the accident.
9、This paper proposes a new algorithm for transient current test (IDDT) generation for delay fault.