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n."ALa"伯学者
1、bist wishes───bist愿望
1、Build-In Self-Test (BIST) is a commonly used DFT technologies.───内建自测试技术是一种普遍使用的可测性设计方法。
2、structure circuit is simple and feasible, and the corresponding algorithm is easy to achieve.───电路结构简单可行，提供的相应算法也易于实现。
3、Template is a cornerstone in the BIST for software, which affect the effectiveness and efficiency in software testing.───模板是软件内建自测试XiTong的基石，其内容关系到整个XiTong的性能和效果。
4、BIST has been applied into transient current testing as an effective method to reduce testing spending.───测试(BIST)是一种有效降低测试开销的技术，在瞬态电流测试中得到了应用。
5、The proposed BIST scheme relies on a pseudo-random testing phase and a deterministic phase.───这一自测试策略包含伪随机测试阶段和确定性测试阶段。
6、Gary Bist is a Staff Technical Writer at IBM's Toronto Lab.───Gary Bist是IBM多伦多实验室的专职技术作家。
7、Define test methodology (SCAN, BIST, JTAG etc. ) for the entire chip. Test pattern generation and optimization.───制定芯片整体测试方法 (S C A N B I S T J T A G)。制定和优化测试模式。
8、Recently, a BIST scheme using test patterns applied by Circuit-under-Test (TPAC) is proposed.───由被测电路自己施加测试向量的内建自测试方法是最近新提出的一种自测试技术。
1、A BIST of 512 bits static RAM by using Concorde Compiler is designed and simulated.
2、The methods of testing VLSI circuits mainly include ATE-based external test, build-in self-test (BIST) and test resource partition (TRP) based optimization test.
3、New design of programmable memory BIST for embedded dual ports SRAM is presented based on analyzing faults model.
4、The implementation of BIST is offered, and the fault-coverage-rate of data rearrangement module and FFT and moduling is calculated.
5、A novel built-in self-test(BIST) test pattern generator(TPG) was designed in order to avoid much hardware overhead and performance degradation when additional TPG was inserted for delay fault test.
6、Du bist echt spiels ü chtig!
7、The BIST of the principle of achieving is introduced first in this paper, then take the 8-bit ripple carry adder as an example, describes the design process of BIST.
8、A fast and improved method for BIST is introduced, which is aimed to improve the fault test method for combinational circuit.
9、With the fast growing portable electronics market and higher need of wafer test, power consumption problem of built in self test (BIST) has attracted more and more considerations.